• Dual-view imaging
  • High-resolution images with 24-bit color
  • Enhanced material discrimination
  • Windows Operating System with
    Intel Core Processor
  • Real-time diagnostics
  • High-contrast image analysis

The XIS-6545DVS is an advanced X-Ray Inspection System (XIS) designed with dual imaging generators, allowing operators to examine objects from multiple angles simultaneously. This reduces potential blind spots and obstructions for operators, and each view can be reviewed independently using Astrophysics multi-colored, high-contrast screening software.

The systems high-quality imaging enables higher throughput, meaning operators spend less time resolving false alarms and conducting manual inspections.

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