• Minimal footprint
  • Dual-view imaging
  • High-resolution images with 24-bit color
  • Enhanced material discrimination
  • Windows Operating System with Intel Core Processor
  • Real-time Diagnostics
  • High-contrast image analysis

The XIS-7858DVS is a dual-view X-Ray Inspection System (XIS) with a small footprint, designed for screening small- to moderately-sized objects in confined locations. Its dual-imaging system delivers two views of scanned objects, allowing operators to manipulate each view independently and examine objects in multiple screening modes simultaneously.

Utilizing Astrophysics best-in-class imaging software, the XIS-7858DVS allows operators to make quick and thorough inspections of complex bags and parcels. Its superior imaging ensures higher throughput, making it the ideal solution for high-traffic security checkpoints.

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