The XIS-6545DVS is an advanced X-Ray Inspection System (XIS) designed with dual imaging generators, allowing operators to examine objects from multiple angles simultaneously. This reduces potential blind spots and obstructions for operators, and each view can be reviewed independently using Astrophysics multi-colored, high-contrast screening software.
The systems high-quality imaging enables higher throughput, meaning operators spend less time resolving false alarms and conducting manual inspections.
STANDARD FEATURES
- 6 Color Imaging
- Color and Black/White Imaging
- Geometric Image Distortion Correction
- High Penetration Function
- Organic/ Inorganic Imaging
- Picture Perfect
- Pseudo Color
- Real- Time Image Manipulation
- Atomic Z-Number Measurement
- Material Discrimination
- 9 Quadrant Zoom
- Continuous Scanning
- Continuous Zoom up to 64x
- Vertical Zoom Panning
- Auto Image Archiving
- Image Review
- Image Annotation
- JPEG Conversion
- Print Image Capable
- Multi-Tier Accessibility
- Network Ready
- Real-Time Self Diagnostic
- Reverse Monochrome
- Density Alert
- Threat Image Projection (TIP)
- Entry/ Exit Roller Tables