XIS 6545DV


  • Dual-view imaging
  • High-resolution images with 24-bit color
  • Enhanced material discrimination
  • Windows Operating System with Intel Core Processor
  • Real-time diagnostics
  • High-contrast image analysis

The XIS-6545DV is an advanced X-Ray Inspection System (XIS) designed for dual-view x-ray screening. Its powerful dual generators provide upward and diagonal viewing angles of screened objects. Each view can be manipulated independently, allowing operators to perform rapid and in-depth inspections while simultaneously using different screening modes.

With Astrophysics best-in-class imaging software, the XIS-6545DV allows operators to inspect objects with colorful, high-contrast filters and identify materials, recognize objects, and isolate threats with increased speed and accuracy.

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