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XIS 6545DV

PRODUCT HIGHLIGHTS

  •  Dual-view imaging
  •  High-contrast image analysis
  •  Tunnel Opening (Width x Height): 65.7 cm X 45.1 cm
  •  Conveyor Speed: 23 cm/s Forward or Reverse
  •  Conveyor Capacity: 165 kg Evenly Distributed Load
  •  Steel Penetration: 41 mm Typical, 39 mm Standard
  •  Contrast Sensitivity: 24 Visible Levels, 4096 Gray Level
  •  X-ray Generator: Dual 180kV

The XIS-6545DV is an advanced X-Ray Inspection System (XIS) designed for dual-view x-ray screening. Its powerful dual generators provide upward and diagonal viewing angles of screened objects. Each view can be manipulated independently, allowing operators to perform rapid and in-depth inspections while simultaneously using different screening modes.

With Astrophysics best-in-class imaging software, the XIS-6545DV allows operators to inspect objects with colorful, high-contrast filters and identify materials, recognize objects, and isolate threats with increased speed and accuracy.

STANDARD FEATURES

  • 6 Color Imaging
  • Color and Black/White Imaging
  • Geometric Image Distortion Correction
  • High Penetration Function
  • Organic/ Inorganic Imaging
  • Picture Perfect
  • Pseudo Color
  • Real- Time Image Manipulation
  • Atomic Z-Number Measurement
  • Material Discrimination
  • 9 Quadrant Zoom
  • Continuous Scanning
  • Continuous Zoom up to 64x
  • Vertical Zoom Panning
  • Auto Image Archiving
  • Image Review
  • Image Annotation
  • JPEG Conversion
  • Print Image Capable
  • Multi-Tier Accessibility
  • Network Ready
  • Real-Time Self Diagnostic
  • Reverse Monochrome
  • Density Alert
  • Threat Image Projection (TIP)
  • Entry/ Exit Roller Tables
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